张红燕, 翟继卫, 张军. “包络法”在Ba(ZrTi)O3铁电薄膜中的应用[J]. Journal of Xinjiang University (Natural Science Edition in Chinese and English), 2006, (3).DOI：
“包络法”在Ba(ZrTi)O3铁电薄膜中的应用
摘要
采用溶胶-凝胶法在石英衬底上制备B a(Z rT i)O3铁电薄膜
U-3010紫外光谱仪测量BZT薄膜的透射光谱
光谱表明制备的BZT薄膜样品厚度均匀
利用“包络法”计算出薄膜的厚度约为301.3nm并得到薄膜的复折射率随入射光频率的变化曲线
进一步拟和出BZT薄膜的透射谱.研究表明在紫外光区到近红外光区“包络法”计算精度高.
Abstract
Ba(ZrTi)O3(BZT) ferroelectric thin films have been put on quartz substrates by a Sol-Gel process.The transmittance of the prepared BZT thin films were investigated by using U-3010 ultraviolet ray survey.Using "envelop method"
we obtained the thick of BZT thin films about 301.3 nm and change of refractivity with the frequency of incident ray.Accordingly
this work indicates that "envelop method" has high accuracy in ultraviolet ray to near infrared.
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references
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